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NIST Database for Simulation of Electron Spectra for Surface Analysis (SESSA): Version 1.0
Select a Keyword
Auger electron backscattering factor
Auger electron lineshape
Auger electron spectroscopy
elastic scattering
elastic scattering cross section
electron impact ionization cross section
electron inelastic mean free path
electron spectroscopy
electron spectroscopy for chemical analysis
fluorescence yield
inelastic mean free path
inelastic scattering
photoelectron lineshape
photoelectron spectroscopy
photoionization asymmetry parameter
photoionization cross section
simulated intensity
simulated spectrum
surface analysis
surface analysis technique
X ray photoelectron spectroscopy

Last modified: November 6, 2008 (Created: November 9, 2001)
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