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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

NIST X-ray Photoelectron Spectroscopy Database

Version 5.0

Last Update to Data Content:  2023

Data Compiled and Evaluated

Alexander V. Naumkin, Anna Kraut-Vass, Stephen W. Gaarenstroom,
and Cedric J. Powell

Software Developed

Angela Y. Lee


The NIST X-ray Photoelectron Spectroscopy (XPS) Database gives easy access to the energies of many photoelectron and Auger-electron spectral lines.  Resulting from a critical evaluation of the published literature, the database contains over 22,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron lines.  A highly interactive program allows the user to search by element, line type, line energy, and many other variables.  Users can easily identify unknown measured lines by matching to previous measurements.

logo for SRD 20
NIST recently released a new version of the NIST Inorganic Crystal Structure Database (ICSD) SRD 3. For more information visit
May 19, 2021

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