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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Ettedgui E., Park K.T., Cao J., Gao Y., Ruckman M.W., J. Appl. Phys. 77, 5411 (1995)DOI:

Instruction:Total Records:   4
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