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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Hagio T., Takase A., Umebayashi S., J. Mater. Sci. Lett. 11, 878 (1992)DOI:

Instruction:Total Records:   22
Element
 
Atomic No
 
Formula
 
Spectral Line
 
Energy (eV)
 
Details
 
Si 14 AlN7OSi5 2p 101.60
Al 13 AlN7OSi5 2p 74.50
O 8 AlN7OSi5 1s 532.20
N 7 AlN7OSi5 1s 397.40
Si 14 Al2N6O2Si4 2p 101.70
Al 13 Al2N6O2Si4 2p 74.50
O 8 Al2N6O2Si4 1s 532.00
N 7 Al2N6O2Si4 1s 397.20
Si 14 Al3N5O3Si3 2p 101.70
Al 13 Al3N5O3Si3 2p 74.50
O 8 Al3N5O3Si3 1s 531.80
N 7 Al3N5O3Si3 1s 397.00
Si 14 Al4N4O4Si2 2p 101.70
Al 13 Al4N4O4Si2 2p 74.50
O 8 Al4N4O4Si2 1s 531.60
N 7 Al4N4O4Si2 1s 396.80
Si 14 SiO2 2p 103.10
O 8 SiO2 1s 532.50
Al 13 AlN 2p 73.10
N 7 AlN 1s 396.20
Si 14 (MgO)0.047Si3N4 2p 101.70
N 7 (MgO)0.047Si3N4 1s 397.70
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