There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Kawamura M., Abe Y., Yanagisawa H., Sasaki K., Thin Solid Films 287, 115 (1996)DOI:

Instruction:Total Records:   6
An error has occurred. This application may no longer respond until reloaded. Reload 🗙