NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:

Kawamura M., Abe Y., Yanagisawa H., Sasaki K., Thin Solid Films 287, 115 (1996)DOI:

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 6

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

Ti

22

TiN

2p_3/2

455.40

N

7

TiN

1s

397.80

Ti

22

TiN₀.₂₃

2p_3/2

454.30

N

7

TiN₀.₂₃

1s

397.30

Ti

22

TiN₀.₂₈

2p_3/2

454.40

N

7

TiN₀.₂₈

1s

397.30

An error has occurred. This application may no longer respond until reloaded. Reload 🗙