There was a problem with the connection!
U.S. flag

An official website of the United States government

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Knight J.M., Fonseca J.L.C., Hauptman Z.V., Badyal J.P.S., Chem. Mater. 5, 1221 (1993)DOI:

Instruction:Total Records:   2
An error has occurred. This application may no longer respond until reloaded. Reload 🗙