There was a problem with the connection!
U.S. flag

An official website of the United States government

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Langevoort J.C., Suthrland I., Hanekamp L.J., Gellings P.J., Appl. Surf. Sci. 28, 167 (1987)DOI:

Instruction:Total Records:   3
An error has occurred. This application may no longer respond until reloaded. Reload 🗙