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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:

Ley L., Wang Y., Van V.N., Fisson S., Souche D., Vuye G., et al., Thin Solid Films 270, 561 (1995)DOI:

Instruction:Total Records:   4
Atomic No
Spectral Line
Energy (eV)
Si 14 Si DS-2p 0.60
Si 14 Pt/Si 2p3/2 100.10
Pt 78 Pt/Si 4f7/2 72.50
Si 14 Si 2p3/2 99.30
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