NIST X-ray Photoelectron Spectroscopy Database

Marshbanks T.L., Jugduth H.K., Delgass W.N., Franses E.I., Thin Solid Films 232, 126 (1993)DOI:

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 7

Element	Atomic No	Formula	Spectral Line	Energy (eV)

Cd	48	(CH₃(CH₂)₁₆C(O)O)₂Cd/Si	DS-3d	6.70
Si	14	Si/(CH₃(CH₂)₁₆C(O)O)₂Cd	DS-2p	0.60
C	6	(CH₃(CH₂)₁₆C(O)O)₂Cd/Si	1s	285.80
C	6	(CH₃(CH₂)₁₆C(O)O)₂Cd/Si	1s	289.60
Cd	48	(CH₃(CH₂)₁₆C(O)O)₂Cd/Si	3d_3/2	413.20
Si	14	Si/(CH₃(CH₂)₁₆C(O)O)₂Cd	2p	98.80
Si	14	Si/(CH₃(CH₂)₁₆C(O)O)₂Cd	2p	103.00