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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Simpson W.C., Shuh D.K., Hung W.H., Hakansson M.C., Kanski J., et al., J. Vac. Sci. Technol. A 14, 1815 (1996)DOI:

Instruction:Total Records:   11
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