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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Thomas V.P., Beyer L., Hennig K., Hoyer E., Nefedov V.I., Zumadilov E.K., Z. Anorg. Allg. Chem. 437, 299 (1977)
Instruction:Total Records:   9
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