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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Tong W.M., Ohlberg D.A.A., You H.K., Williams R.S, Anz S.J., Alvarez M.M., et al, J. Phys. Chem. 95, 4709 (1991)DOI:

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