NIST X-ray Photoelectron Spectroscopy Database

Venezia A.M., Bertoncello R., Deganello G., Surf. Interface Anal. 23, 239 (1995)DOI:

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 20

Element	Atomic No	Formula	Spectral Line	Energy (eV)

Ni	28	NiO	DS-2p	18.40
Ni	28	Ni(OH)₂	DS-2p	17.70
Ni	28	Ni	DS-2p	17.20
Ni	28	Ni/Al₂O₃	DS-2p	17.60
Ni	28	Ni	2p_3/2	852.60
Ni	28	Ni(OH)₂	2p_3/2	855.70
Ni	28	Ni(OH)₂	2p_3/2, sat	861.10
O	8	Ni(OH)₂	1s	531.20
Ni	28	NiO	2p_3/2	853.70
Ni	28	NiO	2p_3/2, sat	855.30
Ni	28	NiO	2p_3/2, sat	860.40
O	8	NiO	1s	529.20
O	8	NiO	1s	531.00
O	8	SiO₂	1s	533.20
Si	14	SiO₂	2p	103.70
Al	13	Ni/Al₂O₃	2s	119.00
O	8	Ni/Al₂O₃	1s	530.70
O	8	Ni/Al₂O₃	1s	532.20
Ni	28	Ni/Al₂O₃	2p_3/2	855.40
Ni	28	Ni/Al₂O₃	2p_3/2, sat	861.00