NIST X-ray Photoelectron Spectroscopy Database

van Weeren R., Leone E.A., Curran S., Klein L.C., Danforth S.C., J. Am. Ceram. Soc. 77, 2699 (1994)DOI:

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 9

Element	Atomic No	Formula	Spectral Line	Energy (eV)

Si	14	Si₃₂O₄₉N₁₉	2p	102.80
O	8	Si₃₂O₄₉N₁₉	1s	532.60
N	7	Si₃₂O₄₉N₁₉	1s	398.10
Si	14	Si₃₃O₄₄N₂₂	2p	102.40
O	8	Si₃₃O₄₄N₂₂	1s	532.20
N	7	Si₃₃O₄₄N₂₂	1s	398.10
Si	14	Si₃₅O₂₆N₃₈	2p	102.40
O	8	Si₃₅O₂₆N₃₈	1s	532.40
N	7	Si₃₅O₂₆N₃₈	1s	397.80