General:
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Element:
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O
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Formula:
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SiO2
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XPS Formula:
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Name:
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silicon(IV) dioxide
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CAS Registry No:
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7631-86-9
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Classes:
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anhydride, IV-VI semiconductor, oxide
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Citation:
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Author Name(s):
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Rueda F., Mendialdua J., Rodriguez A., Casanova R., Barbaux Y., et al.
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Journal:
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J. Electron Spectrosc. Relat. Phenom. 82, 135 (1996)
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Data Processing:
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Data Type:
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Photoelectron Line
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Line Designation:
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1s
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Quality of Data:
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Adequate
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Binding Energy (eV)
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532.7
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Energy Uncertainty:
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Background Subtraction Method:
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Peak Location Method:
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data
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Full Width at Half-maximum Intensity (eV):
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Gaussian Width (eV):
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Lorentzian Width (eV):
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Measurement Information:
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Use of X-ray Monochromator:
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No
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Excitation Energy:
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Al
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X-ray Energy:
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Overal Energy Resolution (eV):
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Calibration:
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Charge Reference:
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Adventitious carbon
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Energy Scale Evalution:
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Reliable, with one-point correction of energy scale
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Specimen Information:
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Specimen:
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annealed, insulator
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Method of Determining Specimen Composition:
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|
Method of Determining Specimen Crystallinity:
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Specimen Temperature (K):
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300
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Sample Quality:
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Adequate
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:
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Notes:
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FRR mode. The sample was pressed into indium sample holder. The sample was calci
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