Detail summary:
General Citation Data Processing Measurement Information Specimen Information Comment
General:
Element: O
Formula: SiO2
XPS Formula: SiO*2
Name: silicon(IV) dioxide
CAS Registry No: 7631-86-9
Classes: anhydride, IV-VI semiconductor, oxide
Citation:
Author Name(s): Hartley M.A., Chiang J.N., Hess D.W., Soane D.S.
Journal: Appl. Phys. Lett. 54, 1510 (1989)
Data Processing:
Data Type: Photoelectron Line
Line Designation: 1s
Quality of Data: Adequate
Binding Energy (eV) 533.0
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method: data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Measurement Information:
Use of X-ray Monochromator: No
Excitation Energy: Al
X-ray Energy:
Overal Energy Resolution (eV):
Calibration:
Charge Reference: Adventitious carbon
Energy Scale Evalution: Reliable, with one-point correction of energy scale
Specimen Information:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K): 300
Sample Quality: Adequate
Comment:
Notes:
General Citation Data Processing Measurement Information Specimen Information Comment
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