Detail summary:
General Citation Data Processing Measurement Information Specimen Information Comment

General:
Element: Na
Formula: NaF
XPS Formula: Na*F
Name: sodium fluoride
CAS Registry No: 7681-49-4
Classes: alkali, fluoride
Citation:
Author Name(s): Kamada M., Aita O., Ichikawa K., Tsutsumi K.
Journal: Phys. Rev. B 36, 4962 (1987)
Data Processing:
Data Type: Photoelectron Line
Line Designation: 2p
Quality of Data: Adequate
Binding Energy (eV) 24.7
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method: data
Full Width at Half-maximum Intensity (eV): 1.9
Gaussian Width (eV):
Lorentzian Width (eV):
Measurement Information:
Use of X-ray Monochromator: Yes
Excitation Energy: other source
X-ray Energy: 40
Overal Energy Resolution (eV): 0.4
Calibration:
Charge Reference: Valence band minimum
Energy Scale Evalution: Reliable (reported energy within 300 eV of a reference energy)
Specimen Information:
Specimen: thin film, vapor deposited
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K): 300
Sample Quality: Adequate
Comment:
Notes: The very thin samples were prepared in situ by evaporation onto gold substrates. The thickness of the samples was estimated to be about 100 A with an oscillating-quartz thickness gauge.

General Citation Data Processing Measurement Information Specimen Information Comment

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