| General:
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| Element:
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Ar
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| Formula:
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Ar0.041C0.959
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| XPS Formula:
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| Name:
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argon in graphite
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| CAS Registry No:
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7440-37-1
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| Classes:
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element
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| Citation:
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| Author Name(s):
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Wagner C.D., Riggs W.M., Davis L.E., Moulder J.F., Muilenberg G.E.
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| Journal:
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Handbook of X-Ray Photoelectron Spectroscopy, Perkin-Elmer Corporation, Physical Electronics Division, Eden Prairie, Minn. 55344 (1979)
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| Data Processing:
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| Data Type:
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Photoelectron Line
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| Line Designation:
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2p3/2
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| Quality of Data:
|
|
|
Binding Energy (eV)
|
241.5
|
| Energy Uncertainty:
|
|
| Background Subtraction Method:
|
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| Peak Location Method:
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| Full Width at Half-maximum Intensity (eV):
|
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| Gaussian Width (eV):
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| Lorentzian Width (eV):
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| Measurement Information:
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| Use of X-ray Monochromator:
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No
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| Excitation Energy:
|
|
| X-ray Energy:
|
|
| Overal Energy Resolution (eV):
|
|
| Calibration:
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Au,Cu
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| Charge Reference:
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Conductor
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| Energy Scale Evalution:
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Reliable, with two-point correction of energy scale
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| Specimen Information:
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| Specimen:
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implanted
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| Method of Determining Specimen Composition:
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| Method of Determining Specimen Crystallinity:
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| Specimen Temperature (K):
|
|
| Sample Quality:
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|
| :
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| Notes:
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