| General:
|
| Element:
|
Xe
|
| Formula:
|
Xe
|
| XPS Formula:
|
in graphite
|
| Name:
|
xenon in graphite
|
| CAS Registry No:
|
7440633
|
| Classes:
|
element
|
| Citation:
|
| Author Name(s):
|
Wagner C.D., Riggs W.M., Davis L.E., Moulder J.F., Muilenberg G.E.
|
| Journal:
|
Handbook of X-Ray Photoelectron Spectroscopy, Perkin-Elmer Corporation, Physical Electronics Division, Eden Prairie, Minn. 55344 (1979)
|
| Data Processing:
|
| Data Type:
|
Photoelectron Line
|
| Line Designation:
|
3d5/2
|
| Quality of Data:
|
|
|
Binding Energy (eV)
|
669.65
|
| Energy Uncertainty:
|
|
| Background Subtraction Method:
|
|
| Peak Location Method:
|
|
| Full Width at Half-maximum Intensity (eV):
|
|
| Gaussian Width (eV):
|
|
| Lorentzian Width (eV):
|
|
| Measurement Information:
|
| Use of X-ray Monochromator:
|
No
|
| Excitation Energy:
|
|
| X-ray Energy:
|
|
| Overal Energy Resolution (eV):
|
|
| Calibration:
|
Au,Cu
|
| Charge Reference:
|
Conductor
|
| Energy Scale Evalution:
|
Reliable, with two-point correction of energy scale
|
| Specimen Information:
|
| Specimen:
|
implanted
|
| Method of Determining Specimen Composition:
|
|
| Method of Determining Specimen Crystallinity:
|
|
| Specimen Temperature (K):
|
|
| Sample Quality:
|
|
| :
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| Notes:
|
|