Detail summary:
General Citation Data Processing Measurement Information Specimen Information Comment

General:
Element: O
Formula: SiO2
XPS Formula: SiO2
Name: silicon dioxide (CasNo: 7631-86-9)
CAS Registry No: 7631-86-9
Classes: IV semiconductor, mineral, oxide
Citation:
Author Name(s): Finster J., Klinkenberg E.-D., Heeg J.
Journal: Vacuum 41, 1586 (1990)
Data Processing:
Data Type: Photoelectron Line
Line Designation: 1s
Quality of Data: Adequate
Binding Energy (eV) 533.2
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method: data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Measurement Information:
Use of X-ray Monochromator: No
Excitation Energy: Al
X-ray Energy:
Overal Energy Resolution (eV):
Calibration:
Charge Reference: Adventitious carbon
Energy Scale Evalution: Reliable, with one-point correction of energy scale
Specimen Information:
Specimen: alpha phase, crystal, insulator
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K): 300
Sample Quality: Adequate
Comment:
Notes: Alpha-quartz.

General Citation Data Processing Measurement Information Specimen Information Comment

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