Detail summary:
General Citation Data Processing Measurement Information Specimen Information Comment

General:
Element: Si
Formula: SiO2
XPS Formula:
Name: silicon dioxide (CasNo: 7631-86-9)
CAS Registry No: 7631-86-9
Classes: IV semiconductor, mineral, oxide
Citation:
Author Name(s): Edgell M.J., Baer D.R., Castle J.E.
Journal: Appl. Surf. Sci. 26, 129 (1986)
Data Processing:
Data Type: Photoelectron Line
Line Designation: 2p
Quality of Data: Adequate
Binding Energy (eV) 104.0
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method: data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Measurement Information:
Use of X-ray Monochromator: Yes
Excitation Energy: other anode
X-ray Energy:
Overal Energy Resolution (eV):
Calibration: Cu2p,3p = 932.67, 75.13
Charge Reference: Gold
Energy Scale Evalution: Reliable, with one-point correction of energy scale
Specimen Information:
Specimen: amorphous, insulator
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K): 293
Sample Quality: Good
Comment:
Notes: Fused silica (Vitreosil, derived from quartz crystal). A flood gun was used for charge neutralization.

General Citation Data Processing Measurement Information Specimen Information Comment

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