Detail summary:
General Citation Data Processing Measurement Information Specimen Information Comment

General:
Element: Si
Formula: SiO2
XPS Formula:
Name: silicon dioxide (CasNo: 7631-86-9)
CAS Registry No: 7631-86-9
Classes: IV semiconductor, mineral, oxide
Citation:
Author Name(s): Laczka M., Beier W., Stoch L.
Journal: Glastechn. Berichte 62, 320 (1989)
Data Processing:
Data Type: Photoelectron Line
Line Designation: 2p
Quality of Data: Good
Binding Energy (eV) 103.3
Energy Uncertainty: 0.1
Background Subtraction Method: other
Peak Location Method: data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Measurement Information:
Use of X-ray Monochromator: No
Excitation Energy: Al
X-ray Energy:
Overal Energy Resolution (eV):
Calibration:
Charge Reference: Adventitious carbon
Energy Scale Evalution: Reliable, with one-point correction of energy scale
Specimen Information:
Specimen: crystal, insulator
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K): 293
Sample Quality: Good
Comment:
Notes: Quartz (rock crystal).

General Citation Data Processing Measurement Information Specimen Information Comment

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