Detail summary:
General Citation Data Processing Measurement Information Specimen Information Comment

General:
Element: Si
Formula: SiO2
XPS Formula:
Name: silicon dioxide (CasNo: 7631-86-9)
CAS Registry No: 7631-86-9
Classes: IV semiconductor, mineral, oxide
Citation:
Author Name(s): Bell F.G., Ley L.
Journal: Phys. Rev. B 37, 8383 (1988)
Data Processing:
Data Type: Photoelectron Line
Line Designation: 2p
Quality of Data: Adequate
Binding Energy (eV) 104.0
Energy Uncertainty: 0.1
Background Subtraction Method:
Peak Location Method: data
Full Width at Half-maximum Intensity (eV): 2.15
Gaussian Width (eV):
Lorentzian Width (eV):
Measurement Information:
Use of X-ray Monochromator: No
Excitation Energy: Al
X-ray Energy:
Overal Energy Resolution (eV):
Calibration: FL = Fermi level
Charge Reference: Mo FL
Energy Scale Evalution: Reliable (reported energy within 300 eV of a reference energy)
Specimen Information:
Specimen: insulator, thick oxide
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K): 293
Sample Quality: Good
Comment:
Notes: Fermi level of Mo was used for charge reference. Mo was sputter deposited onto silica surface.

General Citation Data Processing Measurement Information Specimen Information Comment

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