| General:
|
| Element:
|
Al
|
| Formula:
|
Al2O3
|
| XPS Formula:
|
|
| Name:
|
dialuminum trioxide
|
| CAS Registry No:
|
1344-28-1
|
| Classes:
|
anhydride, catalyst, II-VI semiconductor, mineral, oxide
|
| Citation:
|
| Author Name(s):
|
Hagio T., Takase A., Umebayashi S.
|
| Journal:
|
J. Mater. Sci. Lett. 11, 878 (1992)
|
| Data Processing:
|
| Data Type:
|
Photoelectron Line
|
| Line Designation:
|
2p
|
| Quality of Data:
|
Adequate
|
|
Binding Energy (eV)
|
74.4
|
| Energy Uncertainty:
|
|
| Background Subtraction Method:
|
|
| Peak Location Method:
|
data
|
| Full Width at Half-maximum Intensity (eV):
|
2.2
|
| Gaussian Width (eV):
|
|
| Lorentzian Width (eV):
|
|
| Measurement Information:
|
| Use of X-ray Monochromator:
|
No
|
| Excitation Energy:
|
Mg
|
| X-ray Energy:
|
|
| Overal Energy Resolution (eV):
|
|
| Calibration:
|
|
| Charge Reference:
|
Argon
|
| Energy Scale Evalution:
|
Reliable, with one-point correction of energy scale
|
| Specimen Information:
|
| Specimen:
|
solid sample mounted on tape, sputtered in argon
|
| Method of Determining Specimen Composition:
|
|
| Method of Determining Specimen Crystallinity:
|
|
| Specimen Temperature (K):
|
300
|
| Sample Quality:
|
Adequate
|
| :
|
| Notes:
|
The sample was cleaned by Ar+ ion bombardment (Ep = 400 eV, time = 200 s). No Ar+ ion-induced damage to the sample was detected.
|