Detail summary:
General Citation Data Processing Measurement Information Specimen Information Comment
General:
Element: O
Formula: SiO2
XPS Formula:
Name: silicon dioxide
CAS Registry No: 7631-86-9
Classes: catalyst, glass, IV semiconductor, mineral, oxide
Citation:
Author Name(s): Casamassima M., Darque-Ceretti E., Delamare F., Aucouturier M.
Journal: C. R. Acad. Sci. Ser. II 313, 25 (1991)
Data Processing:
Data Type: Photoelectron Line
Line Designation: 1s
Quality of Data: Adequate
Binding Energy (eV) 532.5
Energy Uncertainty: 0.2
Background Subtraction Method:
Peak Location Method: data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Measurement Information:
Use of X-ray Monochromator: No
Excitation Energy: Al
X-ray Energy:
Overal Energy Resolution (eV):
Calibration: Au4f7 = 84.00
Charge Reference: Adventitious carbon
Energy Scale Evalution: Reliable, with one-point correction of energy scale
Specimen Information:
Specimen: polycrystalline
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K): 300
Sample Quality: Adequate
Comment:
Notes:
General Citation Data Processing Measurement Information Specimen Information Comment
Home
 Instruction:
  • Click on an underlined heading in the left column to obtain its definition.