Detail summary:
General Citation Data Processing Measurement Information Specimen Information Comment

General:
Element: O
Formula: SiO2
XPS Formula:
Name: silicon dioxide
CAS Registry No: 7631-86-9
Classes: catalyst, glass, IV semiconductor, mineral, oxide
Citation:
Author Name(s): Paparazzo E., Fanfoni M., Severini E., Priori S.
Journal: J. Vac. Sci. Technol. A 10, 2892 (1992)
Data Processing:
Data Type: Auger-electron Line
Line Designation: KVV
Quality of Data: Good
Kinetic Energy (eV) 506.3
Energy Uncertainty: 0.2
Background Subtraction Method:
Peak Location Method: data
Full Width at Half-maximum Intensity (eV): 6.9
Gaussian Width (eV):
Lorentzian Width (eV):
Measurement Information:
Use of X-ray Monochromator: No
Excitation Energy: Al
X-ray Energy:
Overal Energy Resolution (eV):
Calibration: Au,Ag,Cu = 84.00,368.27,932.67
Charge Reference: Adventitious carbon
Energy Scale Evalution: Reliable, with one-point correction of energy scale
Specimen Information:
Specimen: insulator, thin film
Method of Determining Specimen Composition: X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K): 300
Sample Quality: Good
Comment:
Notes: The spectra were recorded at normal emission and 70 degrees.

General Citation Data Processing Measurement Information Specimen Information Comment

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