Detail summary:
General Citation Data Processing Measurement Information Specimen Information Comment

General:
Element: Sn
Formula: SnS
XPS Formula:
Name: tin sulfide
CAS Registry No: 1314-95-0
Classes: chalcogenide, II-VI semiconductor, IV-VI semiconductor, sulfide
Citation:
Author Name(s): Ettema A.R.H.F., Haas C.
Journal: J. Phys. Cond. Matter 5, 3817 (1993)
Data Processing:
Data Type: Photoelectron Line
Line Designation: 4d
Quality of Data: Adequate
Binding Energy (eV) 24.9
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method: data
Full Width at Half-maximum Intensity (eV): 2.2
Gaussian Width (eV):
Lorentzian Width (eV):
Measurement Information:
Use of X-ray Monochromator: No
Excitation Energy: Al
X-ray Energy:
Overal Energy Resolution (eV):
Calibration: FL = Fermi level
Charge Reference: Conductor
Energy Scale Evalution: Reliable (reported energy within 300 eV of a reference energy)
Specimen Information:
Specimen: crystal, semiconductor, solid sample mounted on tape
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K): 300
Sample Quality: Adequate
Comment:
Notes: The sample was synthesized by heating Sn with the correct molar amount of S for one week. After cooling, small crystals were selected. The sample was cleaned by stripping with Scotch tape

General Citation Data Processing Measurement Information Specimen Information Comment

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