Detail summary:
General Citation Data Processing Measurement Information Specimen Information Comment
General:
Element: O
Formula: SiO2
XPS Formula:
Name: silicon dioxide
CAS Registry No: 7631-86-9
Classes: catalyst, glass, IV semiconductor, mineral, oxide
Citation:
Author Name(s): Stoch A., Stoch J., Rakowska A.
Journal: Surf. Interface Anal. 22, 242 (1994)
Data Processing:
Data Type: Photoelectron Line
Line Designation: 1s
Quality of Data: Adequate
Binding Energy (eV) 533.0
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Measurement Information:
Use of X-ray Monochromator: No
Excitation Energy: Al
X-ray Energy:
Overal Energy Resolution (eV):
Calibration:
Charge Reference: Adventitious carbon
Energy Scale Evalution: Reliable (reported energy within 300 eV of a reference energy)
Specimen Information:
Specimen: insulator, thick film
Method of Determining Specimen Composition: X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K): 300
Sample Quality: Good
Comment:
Notes: Silica coating was deposited from standard solution prepared by mixing tetraethoxysilane and alcohol with HNO3 acid as catalyst.
General Citation Data Processing Measurement Information Specimen Information Comment
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