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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
(V2O5)50(GeO)50
(V*2O5)50(GeO)50
vanadium(V) pentoxide/germanium(II) oxide
germanate, glass, IV-VI semiconductor

Citation:
Khawaja E.E., Hussain Z., Jazzar M.S., Dabboussi O.B.
J. Non-cryst. Solids 93, 45
Pub Year:
1987

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The glass disks were ground into a fine powder which was embedded in a substrate of metallic indium. Changing the reference to In3d5/2=443.83 provided similar results

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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