NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

S₈

sulfur

7704-34-9

chalcogenide, element

Citation:

Author Name(s):

Shul'ga Y.M., Rubtsov V.I., Vasilets V.N., Lobach A.S., Spitsyna N.G., and Yagubskii E.B.

Journal:

Synthetic Metals 70, 1381

DOI:

Pub Year:

1995

book All Records in this Publication

Data Processing:

Photoelectron Line

164.00

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300