NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

palladium

7440-05-3

element

Citation:

Author Name(s):

Venezia A.M., Rossi A., Duca D., Martorana A., Deganello G.

Journal:

Appl. Catalysis A 125, 113

DOI:

Pub Year:

1995

book All Records in this Publication

Data Processing:

Auger-Electron Line

M₄₅N₄₅N₄₅(¹G)

327.40

0.1

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Ag,Cu = 84.00,368.27,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The surface was cleaned by Ar+ ion bombardment (Ep = 3 keV, Ip = 18 microamperes). FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300