NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Al

NiAl₂O₄

nickel aluminate

CAS Registry No:

12004-35-2

aluminate, double oxide, oxide

Citation:

Author Name(s):

Bolt P.H., Ten Grotenhuis E., Geus J.W., Habraken F.H.P.M.

Surf. Sci. 329, 227

Pub Year:

1995

bookAll Records in this Publication

Data Processing:

Photoelectron Line

Line Designation:

2p

Binding Energy (eV)

74.90

Energy Uncertainty:

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The sample was prepared by vapor deposition of 80 nm nickel layer on polycrystaline alpha-Al2O3 substrate and oxidation by annealing (T = 973 K, time = 3h, 80% O2/20 % N2). FAT mode. Emission angle = 15 degrees. FAT mode. Emission angle = 15 degrees.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction, Rutherford Backscattering Spectrometry

Specimen Temperature (K):

300

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