NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

CeO₂

cerium dioxide

1306-38-3

lanthanide, oxide, rare earth

Citation:

Author Name(s):

Hughes A.E., Gorman J.D., Patterson P.J.K., Carter R.

Journal:

Surf. Interface Anal. 24, 634

DOI:

Pub Year:

1996

bookAll Records in this Publication

Data Processing:

Photoelectron Line

529.60

0.1

Background Subtraction Method:

Shirley

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Cu2p3 = 932.67

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

20 and 2000 nm CeO2 were reactively deposited in a vacuum of 7 - 8E-5 Torr of O2 onto Si(100). FAT mode.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300