NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Pd/Si

palladium/silicon

7440-21-3

element, silicide

Citation:

Author Name(s):

Dai D., Davoli I.

Journal:

Vacuum 46, 139

DOI:

Pub Year:

1995

bookAll Records in this Publication

Data Processing:

Photoelectron Line

99.50

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Other, Si2p = 99.34

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

50 A Pd/n-type Si(111) with a carrier concentration of 1E15 cm-3.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300