There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
copper(I) chloride
chloride, II-VI semiconductor

Citation:
Vasquez R.P.
Surf. Sci. Spectra 2, 138
Pub Year:
1993

Data Processing:
Photoelectron Line
mixed Gaussian/Lorentzian

Measurement:
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu = 84.00,932.67
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The powder was pressed into In foil. Emission angle = 55 degrees. The intensity ratio of the Gaussian/Lorentzian components was 60/40. FAT mode. The composition determined by XPS was Cu0.333Cl0.370.

Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

An error has occurred. This application may no longer respond until reloaded. Reload 🗙