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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Cu
Formula:
CuI
Name:
copper(I) iodide
CAS Registry No:
7681-65-4
Class:
II-VI semiconductor, iodide

Citation:
Author Name(s):
Vasquez R.P.
Journal:
Surf. Sci. Spectra 2, 149
DOI:
Pub Year:
1993

Data Processing:
Data Type:
Auger-Electron Line
Line Designation:
L3M45M45(1G)
Kinetic Energy (eV)
916.10
Energy Uncertainty:
Background Subtraction Method:
Shirley
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu = 84.00,932.67
Charge Reference:
Conductor
Energy Scale Evaluation:
One-point correction of energy scale
Comment:
The powder was pressed into In foil. Emission angle = 55 degrees. The intensity ratio of the Gaussian/Lorentzian components was 60/40. FAT mode. The composition determined by XPS was Cu0.516l0.484.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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