Tab Page Summary
Chourasia A.R., Chopra D.R.
Thin Solid Films 266, 298
Instruction:- Click the column to sort in ascending or descending order.
- Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
- Click on the hyperlink in the column for more information.
Total Records: 6
Overall Energy Resolution (eV):
Calibration:
Ag3d5 = 368.27
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The film was deposited at 873 K using TiCl4, H2 and NH3. The thickness of the film was ~ 1000 A. FAT mode.
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300