NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(^-CF(CF₃)^-CF₂^-)m^-(CF₂^-CH₂^-)n

XPS Formula:

(^-C*F(CF₃)^-CF₂^-)m^-(CF₂^-CH₂^-)n

Name:

poly(hexafluoropropylene-vinylidene fluoride)

CAS Registry No:

9011-17-0

Class:

halogenated compound, polymer

Citation:

Author Name(s):

Dapoz S., Betz N., Guittet M.-J., Le Moel A.

Journal:

Nucl. Instruments Methods in Phys. Res. Sec. B 105, 120

DOI:

Pub Year:

1995

bookAll Records in this Publication

Data Processing:

Photoelectron Line

289.60

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

1.36

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

An electron flood gun was used for charge compensation. The relative intensity w

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300