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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
Fe/Si
iron/silicon
12022-99-0
silicide

Citation:
Ruhrnschopf K., Borgmann D., Wedler G.
Thin Solid Films 280, 171
Pub Year:
1996

Data Processing:
Chemical Shift

Measurement:
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
40 ML Fe were deposited onto Si(100)-(2x1) and annealed (T = 730 K, time = 60 min). The substrate was cleaned by Ar+ ion bombardment and rapid thermal annealing by electron beam heating ( T = 1500 - 1600 K).

Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300

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