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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Ni
Formula:
Ni
Name:
nickel
CAS Registry No:
7440-02-0
Class:
element

Citation:
Author Name(s):
Mansour A.N.
Journal:
Surf. Sci. Spectra 3, 221
DOI:
Pub Year:
1994

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p1/2, sat
Binding Energy (eV)
874.89
Energy Uncertainty:
Background Subtraction Method:
Shirley
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
3.65
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Cu 3p3, 2p3 = 75.13, 932.67
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:
The sample was cleaned by ion bombardment (Ep =3 keV, time = 5 min). Emission angle = 45 degrees. FAT mode. Analyzer pass energy = 8.95. Analyzer resolution = 0.13 eV. The relative intensity was 0.07.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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