There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Sn
Formula:
SnO
Name:
tin(II) oxide
CAS Registry No:
21651-19-4
Class:
oxide

Citation:
Author Name(s):
Stranick M.A., Moskwa A.
Journal:
Surf. Sci. Spectra 2, 45
DOI:
Pub Year:
1993

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
3d3/2
Binding Energy (eV)
494.50
Energy Uncertainty:
Background Subtraction Method:
Shirley
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
1.83
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Cu 3p3, Ag, Cu = 75.13, 368.27, 932.67
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:
The composition determined by XPS was Sn0.4938O0.5062. FAT mode. Emission angle An electron flood gun (Ep = 12 eV, Ip = 21 mA) was used for charge compensation.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
An error has occurred. This application may no longer respond until reloaded. Reload 🗙