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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
C
Formula:
(-CH2C(CH3)(C(O)OCH3)-)n
XPS Formula:
(-C(C*H3)(C(O)-O-CH3)-C*H2-)n
Name:
poly(methyl methacrylate)
CAS Registry No:
9011-14-7
Class:
ester, oxygen, polymer, sulfur

Citation:
Author Name(s):
Moulder J.F., Stickle W.F., Sobol P.E.
Journal:
Surf. Sci. Spectra 1, 341
DOI:
Pub Year:
1992

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
284.80
Energy Uncertainty:
Background Subtraction Method:
Shirley
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
1.08
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu = 84.00,932.67
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The composition determined by XPS was C0.740O0.269. The relative intensity is 0.44. An electron flood gun (Ep = 0 eV, Ip = 18 mA) was used for charge compensation. FAT mode. Emission angle = 25 degrees.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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