NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

silver

7440-22-4

element

Citation:

Author Name(s):

Hoflund G.B., Weaver J.F., Epling W.S.

Journal:

Surf. Sci. Spectra 3, 151

DOI:

Pub Year:

1994

book All Records in this Publication

Data Processing:

Photoelectron Line

3d_3/2

373.40

Background Subtraction Method:

Linear

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

1.3

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag = 368.27

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Emission angle = 70 degrees. The sample was cleaned by annealing (T = 523 K) and Ar+ ion bombardment (Ep = 2 keV, time = 35 min). FAT mode.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300