NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

C

(^-CF₂CF₂^-)n

poly(tetrafluoroethylene)

CAS Registry No:

9002-84-0

halogenated compound, polymer

Citation:

Author Name(s):

Ackeret M.

Surf. Sci. Spectra 1, 100

Pub Year:

1992

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Data Processing:

Photoelectron Line

Line Designation:

1s

Binding Energy (eV)

291.79

Energy Uncertainty:

Background Subtraction Method:

Linear

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

1.75

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The composition determined by XPS was C0.3320F0.6609. FAT mode. Emission angle = 52 degrees. An electron flood gun (Ep = 4 eV, Ip = 0.2 m A) was used for charge compensation.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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