NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

C

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

(^-O^-C*(O)^-C₆H₄^-C*(O)^-O^-CH₂^-CH₂^-)n

poly(ethylene terephthalate)

CAS Registry No:

25038-59-9

carboxylic acid, ester, oxygen, phenyl benzene, polymer, sulfur

Citation:

Author Name(s):

Beamson G., Clark D.T., Hayes N.W., Law D.S.-L.

Surf. Sci. Spectra 3, 357

Pub Year:

1994

bookAll Records in this Publication

Data Processing:

Photoelectron Line

Line Designation:

1s

Binding Energy (eV)

288.74

Energy Uncertainty:

Background Subtraction Method:

Linear

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

0.85

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag3d5 = 368.27

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

FAT mode. Emission angle = 45 degrees. Peak locations: Voigt function. The composition determined by XPS was C0.718O0.282. The relative intensity was 0.18. An electron flood gun was used for charge compensation.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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