NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 22

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

284.80

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

286.38

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

288.74

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

1s, sat

291.40

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

1s, sat

293.30

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

1s, sat

295.40

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

531.71

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

533.31

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

1s, sat

535.70

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

1s, sat

538.30

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

1s, sat

540.10

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

284.80

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

286.52

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

288.74

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

1s, sat

291.40

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

1s, sat

293.30

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

1s, sat

295.50

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

531.64

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

533.21

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

1s, sat

535.70

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

1s, sat

538.20

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

1s, sat

539.70

Data Processing:

Photoelectron Line

1s, sat

291.40

Background Subtraction Method:

Linear

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

2.03

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag3d5 = 368.27

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

FAT mode. Emission angle = 45 degrees. Peak locations: Voigt function. The composition determined by XPS was C0.722O0.278. The relative intensity was 0.05.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

550