NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
Tab Page Summary
General:
Ge
Ge
germanium
7440-56-4
element, II-VI semiconductor, IV semiconductor, IV-VI semiconductor
Citation:
Poirier D.M., Weaver J.H.
Surf. Sci. Spectra 2, 242
Pub Year:
1993
Data Processing:
Photoelectron Line
3d5/2
29.33
Shirley
mixed Gaussian/Lorentzian
Measurement:
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu = 84.00,932.67
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:
Ge(100)-(2x1). FAT mode. Emission angle = 55 degrees.
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
295