NIST X-ray Photoelectron Spectroscopy Database

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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

GaP

gallium phosphide

12063-98-8

chalcogenide, II-VI semiconductor, III-V semiconductor, phosphide

Citation:

Author Name(s):

Poirier D.M., Weaver J.H.

Journal:

Surf. Sci. Spectra 2, 263

DOI:

Pub Year:

1993

bookAll Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2

20.15

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

0.65

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

n-type GaP(110) with a carrier concentration of 2 - 4.6E17 cm-3. Zinc blende structure. FAT mode. Emission angle = 55 degrees.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

295