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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Ti
Formula:
TiN
Name:
titanium nitride
CAS Registry No:
25583-20-4
Class:
nitride

Citation:
Author Name(s):
Chourasia A.R., Chopra D.R.
Journal:
Surf. Sci. Spectra 1, 233
DOI:
Pub Year:
1992

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p3/2
Binding Energy (eV)
454.95
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
1.7
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Ag = 84.00,368.27
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:
The composition determined by XPS was Ti0.5113N04887. The sample was cleaned by Ar+ ion bombardment (Ep = 3 keV, Ip = 4 microamperes, angle of incidence = 40 degrees). FAT mode. Emission angle = 45 degrees.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
293
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