NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Al₀.₀₄₁Si₀.₂₆₄Na₀.₀₄K₀.₀₂O₀.₆₃₅

Name:

aluminum silicon sodium potassium oxide

CAS Registry No:

Class:

alkali, oxide, silicate

Citation:

Author Name(s):

Rossi A., Venezia A.M., Deganello G.

Journal:

Surf. Sci. Spectra 3, 112

DOI:

Pub Year:

1994

bookAll Records in this Publication

Data Processing:

Auger-Electron Line

KL₂₃L₂₃(¹D)

989.20

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Cu LMM = 567.97

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Natural pumice. FAT mode. Emission angle = 15 degrees.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):